IEC60529 Standard Test Finger Probe B HT-I02T With 10N , 20N , 30N Force
IEC 61032 figure 2 probe B:
The Test Finger Probe B is a precision test probe made according to Figure 2 (Fig. 2) of the IEC61032 (Test probe B) and is used to simulate a human finger. It is also used by the standards of CSA, IRAM, UL and in most of the rules involved in the verification of accessibility to live parts.
Product information:
This precision test finger is manufactured in accordance with various standards, including IEC 60335-1 Clauses 8.1.1, 8.2, 22.1, 29.1, IEC 61032 Figure 2, IEC 60950 Figure 2A, IEC 60884, UL 507, and UL 1278 Figure 8.4. Its purpose is to validate the fundamental safeguarding measures against accessing hazardous components. Additionally, it serves to assess the protection level against finger access. This test finger probe comprises a dito, finger, base, and an insulated handle, designed to mimic the characteristics of a human hand. Featuring two movable joints, it can be bent at a 90° angle, providing flexibility and accuracy during testing.
Customizable: equipped with detachable banana plugs and an amphenol connector at the end of the handle, this precision test finger can be utilized for anti-electric shock testing. Alternatively, by opening the threaded hole of M6 at the handle's terminus and connecting it to a pull and push dynamometer, it can be employed for enclosure protection testing. This versatility allows the test finger to adapt to different testing scenarios, ensuring accurate and reliable results.
Main specification and corresponding technical parameters:
| Model | HT-I02 | HT-I02A | HT-I02B | HT-I02T |
| Name | Standard Test Finger | Circular Baffle Test finger | Large Baffle Test Finger | Standard Test Finger With Force |
| Finger length | 80±0.2 | 80±0.2 | 100±0.2 | 80±0.2 |
| Fingertip to baffle | 180±0.2 | 180±0.2 | ---- | 180±0.2 |
| Cylindrical | R2±0.05 | R2±0.05 | R2±0.05 | R2±0.05 |
| Spherical | R4±0.05 | R4±0.05 | R4±0.05 | R4±0.05 |
| Joint 1 | 30±0.2 | 30±0.2 | 30±0.2 | 30±0.2 |
| Joint 2 | 60±0.2 | 60±0.2 | 60±0.2 | 60±0.2 |
| Fingertip cutting bevel angle | 37o 0 -10′ | 37o 0 -10′ | 37o 0 -10′ | 37o 0 -10′ |
| A-A Section diameter | Ф50 | Ф50 | ---- | Ф50 |
| Fingertip taper | 14 o 0 -10′ | 14 o 0 -10′ | 14 o 0 -10′ | 14 o 0 -10′ |
| A-A Section width | 20±0.2 | ---- | ---- | 20±0.2 |
| Baffle diameter | Ф75±0.2 | Ф75±0.2 | Ф125±0.2 | Ф75±0.2 |
| Baffle thickness | 5±0.5 | 5±0.5 | ---- | 5±0.5 |
| Force | ---- | ---- | ---- | With force of 10N, 20N,30N |
| Test finger diameter | Ф12 0 -0.05 | Ф12 0 -0.05 | Ф12 0 -0.05 | Ф12 0 -0.05 |
| Applied standard | IEC61032-1 | IEC60335-1 | IEC60335-2-14 | IEC60529-1 |
Product Tags:
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IEC60529 Standard Test Finger Probe B HT-I02T With 10N , 20N , 30N Force Images
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