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IEC60529-1 Test Finger Probe Test Finger Probe B With Force Of 10N , 20N , 30N

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IEC60529-1 Test Finger Probe Test Finger Probe B With Force Of 10N , 20N , 30N

Brand Name : HongCe

Model Number : HT-I02T

Certification : Calibration certificate(cost additional)

Place of Origin : China

MOQ : 1 set

Price : Negotiatable

Payment Terms : T/T

Supply Ability : 30 sets per month

Delivery Time : 7 days

Packaging Details : Aluminum box

Product name : Test Finger Probe B

Material : Plastic + stainless steel

Color : White

Usage : IEC test equipment

Warranty : 1 Year

Lead time : Within very short time

Standards : IEC60529-1

Force : 10N, 20N, 30N

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IEC60529-1 Test Finger Probe Test Finger Probe B With Force Of 10N , 20N , 30N

Standard: IEC 61032 figure 2, IEC60950 figure 2A, IEC60884, IEC60335, UL507, and UL1278 figure 8.4.

Application: This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

Test sample: Easily accessible enclosure live parts or mechanical parts.

Feature: This test finger probe consists of dito, finger, base and insulated handle which simulates the characteristics of the human hand. It has two movable joints, which can be curved at 90°. Customizable: it can be used for anti-electric shock test when equipped with pluggable banana plugs and amphenol connector at the end of the handle , or used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamometer).

Parameters(mm):

Model HT-I02 HT-I02A HT-I02B HT-I02T
Name Standard Test Finger Circular Baffle Test finger Large Baffle Test Finger Standard Test Finger With Force
Joint 1 30±0.2 30±0.2 30±0.2 30±0.2
Joint 2 60±0.2 60±0.2 60±0.2 60±0.2
Finger length 80±0.2 80±0.2 100±0.2 80±0.2
Fingertip to baffle 180±0.2 180±0.2 ---- 180±0.2
Cylindrical R2±0.05 R2±0.05 R2±0.05 R2±0.05
Spherical R4±0.05 R4±0.05 R4±0.05 R4±0.05
Fingertip cutting bevel angle 37o 0 -10′ 37o 0 -10′ 37o 0 -10′ 37o 0 -10′
Fingertip taper 14 o 0 -10′ 14 o 0 -10′ 14 o 0 -10′ 14 o 0 -10′
Test finger diameter Ф12 0 -0.05 Ф12 0 -0.05 Ф12 0 -0.05 Ф12 0 -0.05
A-A Section diameter Ф50 Ф50 ---- Ф50
A-A Section width 20±0.2 ---- ---- 20±0.2
Baffle diameter Ф75±0.2 Ф75±0.2 Ф125±0.2 Ф75±0.2
Baffle thickness 5±0.5 5±0.5 ---- 5±0.5
Force ---- ---- ---- With force of 10N, 20N,30N
Applied standard IEC61032-1 IEC60335-1 IEC60335-2-14 IEC60529-1

IEC60529-1 Test Finger Probe Test Finger Probe B With Force Of 10N , 20N , 30N

IEC60529-1 Test Finger Probe Test Finger Probe B With Force Of 10N , 20N , 30N


Product Tags:

IEC 60529-1 Test Finger Probe

      

30N Test Finger Probe

      

10N Test Finger Probe

      
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